DOI: 10.1002/adma.200903909. Three‐Dimensional Atomic Force Microscopy

Three‐Dimensional Atomic Force Microscopy – Taking Surface Imaging to the Next Level

10.1002/adma.200903909

Crossref journal-article

Wiley

Advanced Materials (311)

Abstract

AbstractMaterials properties are ultimately determined by the nature of the interactions between the atoms that form the material. On surfaces, the site‐specific spatial distribution of force and energy fields governs the phenomena encountered. This article reviews recent progress in the development of a measurement mode called three‐dimensional atomic force microscopy (3D‐AFM) that allows the dense, three‐dimensional mapping of these surface fields with atomic resolution. Based on noncontact atomic force microscopy, 3D‐AFM is able to provide more detailed information on surface properties than ever before, thanks to the simultaneous multi‐channel acquisition of complementary spatial data such as local energy dissipation and tunneling currents. By illustrating the results of experiments performed on graphite and pentacene, we explain how 3D‐AFM data acquisition works, what challenges have to be addressed in its realization, and what type of data can be extracted from the experiments. Finally, a multitude of potential applications are discussed, with special emphasis on chemical imaging, heterogeneous catalysis, and nanotribology.

Bibliography

Baykara, M. Z., Schwendemann, T. C., Altman, E. I., & Schwarz, U. D. (2010). ThreeâDimensional Atomic Force Microscopy â Taking Surface Imaging to the Next Level. Advanced Materials, 22(26â27), 2838â2853. Portico.

Authors 4

Mehmet Z. Baykara (first)
Todd C. Schwendemann (additional)
Eric I. Altman (additional)
Udo D. Schwarz (additional)

References 123 Referenced 68

In some instances three‐dimensional imaging by AFM has been referred to as “atomic force tomography” or similar. We feel that this expression is not adequate as the word “tomography” is defined as “a method of producing a three‐dimensional image of the internal structure of a solid object (…︁)” (Merriam‐Webster Online Dictionary 2009 Edition). 3D‐AFM however does not result in information on theinternalforce field of the sample but only on thesurfaceforce (and energy) field and how it extends into vacuum as experienced by a sharp probe tip.
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Note that this is even worse for scanning tunneling microscopy where images reflect planes of constant integrated joint density of states between the tip and sample as it is more difficult to correlate the integrated joint density of states with sites of strongest tip‐sample interaction than correlating planes of constant frequency shift with the same quantity.
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Possible ways to speed up data acquisition compared to the example discussed earlier (90 h for a 256 × 256 point array) could include operation at higher resonances the use of sensors featuring higher resonance frequencies and the development of new electronic components and detection schemes that provide better signal‐to‐noise ratios.
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The average attractive forces and force corrugations are ‐2.31 nN and ∼70 pN (a) ‐2.06 nN and ∼55 pN (b) ‐1.78 nN and ∼40 pN (c) and ‐1.58 nN and ∼20 pN (d) respectively. Note also that the origin of thez‐scale has been set to the height of the closest complete plane imaged and does not indicate a particular “absolute” distance from the surface.
The average attractive energies and corrugations are ‐5.47 eV and 38 meV (a) ‐4.91 eV and 24 meV (b) ‐4.37 eV and 13 meV (c) and ‐4.00 eV and 8 meV (d) respectively.
Note that the data given in Figure 5 has been acquired in the attractive regime while so far nanotribological stick‐slip experiments have only been carried out in repulsive contact. Nevertheless the fundamental process of stick‐slip is expected to remain the same in repulsive as well as in the attractive regime as long as the energy barriers between the potential minima are sufficiently deep compared to the lateral stiffness of the slider.
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M. Z.Baykara T. C.Schwendemann B. J.Albers N.Pilet E. I.Altman U. D.Schwarz in preparation.
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Dates

Type	When
Created	15 years, 4 months ago (April 9, 2010, 5:51 a.m.)
Deposited	2 years ago (Aug. 30, 2023, 1:28 a.m.)
Indexed	1 month, 2 weeks ago (July 19, 2025, 11:37 p.m.)
Issued	15 years, 1 month ago (July 20, 2010)
Published	15 years, 1 month ago (July 20, 2010)
Published Online	15 years, 1 month ago (July 21, 2010)
Published Print	15 years, 1 month ago (July 20, 2010)

Funders 0

None

BibTeX

@article{Baykara_2010, title={Three‐Dimensional Atomic Force Microscopy – Taking Surface Imaging to the Next Level}, volume={22}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.200903909}, DOI={10.1002/adma.200903909}, number={26–27}, journal={Advanced Materials}, publisher={Wiley}, author={Baykara, Mehmet Z. and Schwendemann, Todd C. and Altman, Eric I. and Schwarz, Udo D.}, year={2010}, month=jul, pages={2838–2853} }

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