DOI: 10.1002/adma.200902263. “Charge Leakage” at LaMnO<sub>3</sub>/SrTiO<sub>3</sub> Interfaces

“Charge Leakage” at LaMnO3/SrTiO3 Interfaces

10.1002/adma.200902263

Crossref journal-article

Wiley

Advanced Materials (311)

Bibliography

GarciaâBarriocanal, J., Bruno, F. Y., RiveraâCalzada, A., Sefrioui, Z., Nemes, N. M., GarciaâHernÃ¡ndez, M., RubioâZuazo, J., Castro, G. R., Varela, M., Pennycook, S. J., Leon, C., & Santamaria, J. (2010). âCharge Leakageâ at LaMnO3/SrTiO3 Interfaces. Advanced Materials, 22(5), 627â632. Portico.

Authors 12

Javier Garcia‐Barriocanal (first)
Flavio Y. Bruno (additional)
Alberto Rivera‐Calzada (additional)
Zouhair Sefrioui (additional)
Norbert M. Nemes (additional)
Mar Garcia‐Hernández (additional)
Juan Rubio‐Zuazo (additional)
German R. Castro (additional)
Maria Varela (additional)
Stephen J. Pennycook (additional)
Carlos Leon (additional)
Jacobo Santamaria (additional)

References 35 Referenced 119

10.1038/nature02308
10.1126/science.1146006
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10.1038/nmat1931
10.1126/science.1131091
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10.1038/nature00977
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10.1103/PhysRevLett.97.057601
10.1103/PhysRevLett.99.266801
10.1103/PhysRevLett.99.196404
10.1103/PhysRevLett.100.257203
10.1103/PhysRevLett.44.1597
10.1103/PhysRevB.34.5955
10.1103/PhysRevB.45.9292
10.1016/0956-716X(95)00391-8
10.1103/PhysRevB.76.064303
10.1016/S0038-1101(03)00205-3
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10.1103/PhysRevB.66.174514
10.1006/jssc.1997.7287
10.1080/000187399243455
10.1103/PhysRevB.56.8902
10.1103/PhysRevB.53.3348
10.1063/1.2217983
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10.1038/298635a0
10.1103/PhysRevB.79.085117
The discrepancy between the two methods near the interfaces in the (LMO17/STO12)8sample is most likely due to beam‐broadening. The energy separation must change smoothly across the interface since there is O on both sides. Therefore the Ti oxidation state around +3.5 at the interface obtained by this method is an artifact due to averaging of both materials. On the other hand the Ti edge fine structure does not since there is no Ti in the LMO so the Ti oxidation‐state value at the interface is accurately measured by this method. The reduced overall intensity is normalized out by the MLLS fitting procedure.
10.1046/j.1365-2818.2003.01174.x
Unfortunately the Sr L2 3edge lies at very‐high energy for EELS measurements near 2000 eV. Therefore the Sr L2 3edges show a very‐poor signal‐to‐noise ratio hindering quantification efforts. To get more‐reliable quantitative data we used two different background‐subtraction methods: the power‐law fit and the spatial‐difference technique shown in Figure 2. The fact that a hint of atomic‐resolution contrast is observed in the LMO side of the interface only for the second methods show that this is most likely an artifact.
10.1103/PhysRevLett.86.5156
10.1103/PhysRevB.67.214511
10.1016/j.ultramic.2006.04.016

Dates

Type	When
Created	15 years, 9 months ago (Nov. 24, 2009, 11:04 a.m.)
Deposited	1 year, 9 months ago (Nov. 20, 2023, 6:58 p.m.)
Indexed	3 weeks, 2 days ago (Aug. 6, 2025, 8:12 a.m.)
Issued	15 years, 6 months ago (Feb. 2, 2010)
Published	15 years, 6 months ago (Feb. 2, 2010)
Published Online	15 years, 6 months ago (Feb. 2, 2010)
Published Print	15 years, 6 months ago (Feb. 2, 2010)

Funders 0

None

BibTeX

@article{Garcia_Barriocanal_2010, title={“Charge Leakage” at LaMnO3/SrTiO3 Interfaces}, volume={22}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.200902263}, DOI={10.1002/adma.200902263}, number={5}, journal={Advanced Materials}, publisher={Wiley}, author={Garcia‐Barriocanal, Javier and Bruno, Flavio Y. and Rivera‐Calzada, Alberto and Sefrioui, Zouhair and Nemes, Norbert M. and Garcia‐Hernández, Mar and Rubio‐Zuazo, Juan and Castro, German R. and Varela, Maria and Pennycook, Stephen J. and Leon, Carlos and Santamaria, Jacobo}, year={2010}, month=feb, pages={627–632} }

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