Crossref journal-article
Wiley
Advanced Materials (311)
Bibliography

Tham, D., Nam, C. ‐Y., & Fischer, J. E. (2005). Microstructure and Composition of Focused‐Ion‐Beam‐Deposited Pt Contacts to GaN Nanowires. Advanced Materials, 18(3), 290–294. Portico.

Dates
Type When
Created 19 years, 8 months ago (Dec. 14, 2005, 4:48 a.m.)
Deposited 1 year, 9 months ago (Nov. 20, 2023, 6:51 p.m.)
Indexed 1 year ago (July 22, 2024, 7:36 p.m.)
Issued 19 years, 8 months ago (Dec. 14, 2005)
Published 19 years, 8 months ago (Dec. 14, 2005)
Published Online 19 years, 8 months ago (Dec. 14, 2005)
Published Print 19 years, 6 months ago (Feb. 3, 2006)
Funders 0

None

@article{Tham_2005, title={Microstructure and Composition of Focused‐Ion‐Beam‐Deposited Pt Contacts to GaN Nanowires}, volume={18}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.200501832}, DOI={10.1002/adma.200501832}, number={3}, journal={Advanced Materials}, publisher={Wiley}, author={Tham, D. and Nam, C.‐Y. and Fischer, J. E.}, year={2005}, month=dec, pages={290–294} }