Crossref journal-article
Wiley
Advanced Materials (311)
Abstract

Spatially resolved laser micro‐annealing (process shown on inside front cover) has been used to drive an amorphous to nanocrystalline phase transition in Si inverted colloidal photonic crystals to create micrometer‐sized refractive index patterns (observed as the yellow color in the Figure). This provides a simple means of tailoring the optical properties of Si photonic crystals, and has applications in photonic crystal miniaturized optical components, devices, and circuits.

Bibliography

Tétreault, N., Míguez, H., Yang, S. M., Kitaev, V., & Ozin, G. A. (2003). Refractive Index Patterns in Silicon Inverted Colloidal Photonic Crystals. Advanced Materials, 15(14), 1167–1172. Portico.

Dates
Type When
Created 22 years, 1 month ago (July 22, 2003, 1:11 p.m.)
Deposited 1 year, 9 months ago (Nov. 20, 2023, 10:11 p.m.)
Indexed 1 year, 1 month ago (July 15, 2024, 9:54 a.m.)
Issued 22 years, 1 month ago (July 17, 2003)
Published 22 years, 1 month ago (July 17, 2003)
Published Online 22 years, 1 month ago (July 21, 2003)
Published Print 22 years, 1 month ago (July 17, 2003)
Funders 0

None

@article{T_treault_2003, title={Refractive Index Patterns in Silicon Inverted Colloidal Photonic Crystals}, volume={15}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.200304429}, DOI={10.1002/adma.200304429}, number={14}, journal={Advanced Materials}, publisher={Wiley}, author={Tétreault, N. and Míguez, H. and Yang, S.M. and Kitaev, V. and Ozin, G.A.}, year={2003}, month=jul, pages={1167–1172} }