Crossref journal-article
Wiley
Advanced Materials (311)
Abstract

The external photoluminescence quantum yield of, for example, thin film semiconductors can be conveniently determined using the improved integrating‐sphere method (see Figure) presented here. Spectrally resolved detection allows the excitation source and the emission to be distinguished. The method will be particularly useful for samples with small Stocks' shifts or low photoluminescence quantum yields or for highly scattering samples. Figmagnified image

Bibliography

de Mello, J. C., Wittmann, H. F., & Friend, R. H. (1997). An improved experimental determination of external photoluminescence quantum efficiency. Advanced Materials, 9(3), 230–232. Portico.

Authors 3
  1. John C. de Mello (first)
  2. H. Felix Wittmann (additional)
  3. Richard H. Friend (additional)
References 6 Referenced 1,858
  1. 10.1016/0379-6779(93)91071-9
  2. 10.1016/0379-6779(94)90164-3
  3. {'key': 'e_1_2_1_3_2', 'volume': '89', 'author': 'Greenham N. C.', 'year': '1995', 'journal-title': 'Chem. Phys. Lett.'} / Chem. Phys. Lett. by Greenham N. C. (1995)
  4. J. W. T.Walsh Photometry Constable London1953.
  5. 10.1038/376498a0
  6. 10.1103/PhysRevLett.77.1881
Dates
Type When
Created 20 years, 7 months ago (Dec. 29, 2004, 1:25 a.m.)
Deposited 1 year, 9 months ago (Nov. 20, 2023, 6:22 p.m.)
Indexed 4 days, 8 hours ago (Aug. 20, 2025, 9:18 a.m.)
Issued 28 years, 5 months ago (March 1, 1997)
Published 28 years, 5 months ago (March 1, 1997)
Published Online 20 years, 9 months ago (Oct. 29, 2004)
Published Print 28 years, 5 months ago (March 1, 1997)
Funders 0

None

@article{de_Mello_1997, title={An improved experimental determination of external photoluminescence quantum efficiency}, volume={9}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.19970090308}, DOI={10.1002/adma.19970090308}, number={3}, journal={Advanced Materials}, publisher={Wiley}, author={de Mello, John C. and Wittmann, H. Felix and Friend, Richard H.}, year={1997}, month=mar, pages={230–232} }