DOI: 10.1002/adma.19950070607. Chemical imaging by scanning force microscopy

Chemical imaging by scanning force microscopy

10.1002/adma.19950070607

Crossref journal-article

Wiley

Advanced Materials (311)

Abstract

The chemical imaging of surfaces with high lateral resolution i.e. the chemical identification of the materials which make up the surface was recently reported by Lieber et al. in Science. Here, work carried out partially in parallel using chemically modified SFM tips (see Figure) confirms the power of the technique and emphasizes its use for technical surfaces which normally show little contrast in SFM. magnified image

Bibliography

Akari, S., Horn, D., Keller, H., & Schrepp, W. (1995). Chemical imaging by scanning force microscopy. Advanced Materials, 7(6), 549â551. Portico.

Authors 4

Sabri Akari (first)
Dieter Horn (additional)
Harald Keller (additional)
Wolfgang Schrepp (additional)

References 17 Referenced 84

10.1103/PhysRevLett.49.57
10.1002/anie.199212981
10.1002/sca.4950150504
10.1116/1.574321
10.1007/BF00332592
10.1103/PhysRevLett.59.1942
10.1063/1.1144752
10.1063/1.113000
10.1126/science.259.5092.213
10.1116/1.576168
10.1126/science.8153628
10.1126/science.265.5181.2071
10.1021/ja00351a063
10.1016/0040-6090(92)90408-4
10.1126/science.8171320
10.1002/adma.19940060719
The commercial electronics used for our experiments (TMX 2000) cannot be used for the recording of force‐ distance curves with the 0.3 N/m cantilever as the preamplifier is driven into saturation. The poor sensitivity of the rigid cantilever might be a reason for the absence of hysteresis in Fig. 5 b.

Dates

Type	When
Created	20 years, 7 months ago (Dec. 30, 2004, 1:58 p.m.)
Deposited	1 year, 9 months ago (Nov. 20, 2023, 8:37 p.m.)
Indexed	1 year, 6 months ago (Feb. 2, 2024, 3:43 p.m.)
Issued	30 years, 2 months ago (June 1, 1995)
Published	30 years, 2 months ago (June 1, 1995)
Published Online	20 years, 11 months ago (Sept. 15, 2004)
Published Print	30 years, 2 months ago (June 1, 1995)

Funders 0

None

BibTeX

@article{Akari_1995, title={Chemical imaging by scanning force microscopy}, volume={7}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.19950070607}, DOI={10.1002/adma.19950070607}, number={6}, journal={Advanced Materials}, publisher={Wiley}, author={Akari, Sabri and Horn, Dieter and Keller, Harald and Schrepp, Wolfgang}, year={1995}, month=jun, pages={549–551} }

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