DOI: 10.1002/adma.19950070115. Imaging the surfaces of nanoporous semiconductors by atomic force microscopy

Imaging the surfaces of nanoporous semiconductors by atomic force microscopy

10.1002/adma.19950070115

Crossref journal-article

Wiley

Advanced Materials (311)

Abstract

Open framework semiconductors tin(IV) sulfides and tin(IV) selenides) exhibiting bulk crystalline nanoporosity have been studied using atomic force microscopy (AFM). The bulk porosity is reflected in the surface structures of these materials (see Fig.), and little reconstruction can be detected, important points in the assessment of the electrical transport characteristics of this new class of nanoporous materials. magnified image

Bibliography

Enzel, P., Henderson, G. S., Ozin, G. A., & Bedard, R. L. (1995). Imaging the surfaces of nanoporous semiconductors by atomic force microscopy. Advanced Materials, 7(1), 64â68. Portico.

Authors 4

Patricia Enzel (first)
Grant S. Henderson (additional)
Geoffrey A. Ozin (additional)
Robert L. Bedard (additional)

References 29 Referenced 30

10.1103/PhysRevLett.55.394
10.1063/1.881238
10.1126/science.254.5036.1319
G. S.Henderson G. A.Vrdoliak R. K.Eby F. J.Wicks A. L.Rachlin.Coll. Surf. A.in press.
10.1002/adma.19930051003
10.1002/adma.19930050515
10.1126/science.2928794
10.1126/science.247.4948.1330
10.1016/0144-2449(91)80291-7
10.1016/S0144-2449(05)80112-5
10.1016/0039-6028(93)90631-S / Surf. Sci. Lett. by Scandella L. (1993)
10.1038/365239a0
R. L.Bedard L. D.Vail S. L.Wilson E. M.Flanigen US Patent 4 1989 880 761.
10.1557/PROC-286-93
{'key': 'e_1_2_1_5_3', 'series-title': 'ACS Symp., Washington 1992, Adv. Chem. Ser.', 'volume-title': 'Nanomaterials: Endosemicondui‐tors and Exosemiconductors in Materials Chemistry: An Emerging Subdiscipline', 'author': 'Ozin G. A.', 'year': '1994'} / Nanomaterials: Endosemicondui‐tors and Exosemiconductors in Materials Chemistry: An Emerging Subdiscipline / ACS Symp., Washington 1992, Adv. Chem. Ser. by Ozin G. A. (1994)
10.1002/adma.19940061114
T.Jiang G. A.Ozin R. L.Bedard Adv. Mater. in press.
T.Liang A. J.Lough.G. A.Ozin D.Young R. L.Bedard Chem. Mater. in press.
H.Ahari C. L.Bowes T.Jiang A. J.Lough G. A.Ozin S.Petrov D.Young R. L.Bedard Adv. Mater. in press.
{'key': 'e_1_2_1_6_6', 'volume': '7', 'author': 'Ahari H.', 'year': '1995', 'journal-title': 'Adv. Mater.'} / Adv. Mater. by Ahari H. (1995)
G. A.Ozin Supramol. Chem. in press.
T.Jiang A.Kuperman G. A.Ozin A.Verma R. L.Bedard unpublished.
10.1002/adma.19920041003
10.1126/science.260.5113.1451
10.1103/PhysRevLett.60.1314
Unfiltered images available as supplementary material from the author.
Crystal structure simulations were prepared with the Cerius software developed and distributed by Molecular Simulations Cambridge. UK. The simulations were constructed based on single crystal X‐ray diffraction parameters presented in [5 6].
Calculated values were derived from crystallographic data with the ionicradii of the chalcogenide atoms accounted for. A large sampling of measurements was done throughout the AFM images and the presented values represent the statistical mean.
10.1021/la00033a001

Dates

Type	When
Created	20 years, 7 months ago (Dec. 29, 2004, 1:06 a.m.)
Deposited	1 year, 9 months ago (Nov. 20, 2023, 7:20 p.m.)
Indexed	1 year, 1 month ago (July 19, 2024, 1:07 p.m.)
Issued	30 years, 7 months ago (Jan. 1, 1995)
Published	30 years, 7 months ago (Jan. 1, 1995)
Published Online	20 years, 11 months ago (Sept. 15, 2004)
Published Print	30 years, 7 months ago (Jan. 1, 1995)

Funders 0

None

BibTeX

@article{Enzel_1995, title={Imaging the surfaces of nanoporous semiconductors by atomic force microscopy}, volume={7}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.19950070115}, DOI={10.1002/adma.19950070115}, number={1}, journal={Advanced Materials}, publisher={Wiley}, author={Enzel, Patricia and Henderson, Grant S. and Ozin, Geoffrey A. and Bedard, Robert L.}, year={1995}, month=jan, pages={64–68} }

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