Crossref journal-article
Wiley
Advanced Materials (311)
Abstract

Due to its high sensitivity, scanning force microscopy offers the possibility to map minute van der Waals forces between microprobe and sample surface at high spatial resolution. A detailed theoretical analysis confirms that the interactions involved directly reflect near‐surface dielectric properties hardly accessible to conventional detection techniques. This opens a new field of application to modern scanned‐probe techniques: van der Waals microscopy.

Bibliography

Hartmann, U. (1990). van der waals interactions in force microscopy. Advanced Materials, 2(12), 594–597. Portico.

Authors 1
  1. Uwe Hartmann (first)
References 10 Referenced 9
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Dates
Type When
Created 20 years, 7 months ago (Dec. 30, 2004, 1:32 p.m.)
Deposited 1 year, 9 months ago (Oct. 30, 2023, 10:57 p.m.)
Indexed 1 year, 9 months ago (Nov. 1, 2023, 3:34 a.m.)
Issued 34 years, 8 months ago (Dec. 1, 1990)
Published 34 years, 8 months ago (Dec. 1, 1990)
Published Online 20 years, 11 months ago (Sept. 15, 2004)
Published Print 34 years, 8 months ago (Dec. 1, 1990)
Funders 0

None

@article{Hartmann_1990, title={van der waals interactions in force microscopy}, volume={2}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.19900021208}, DOI={10.1002/adma.19900021208}, number={12}, journal={Advanced Materials}, publisher={Wiley}, author={Hartmann, Uwe}, year={1990}, month=dec, pages={594–597} }