Abstract
Due to its high sensitivity, scanning force microscopy offers the possibility to map minute van der Waals forces between microprobe and sample surface at high spatial resolution. A detailed theoretical analysis confirms that the interactions involved directly reflect near‐surface dielectric properties hardly accessible to conventional detection techniques. This opens a new field of application to modern scanned‐probe techniques: van der Waals microscopy.
References
10
Referenced
9
- E. M.Lifshitz.Sov. Phys.—JETP 2(1956)73.
- I. E.Dzyaloshinskii.E. M.Lifshitz L. P.Pitaevskii.Sov. Phys.—JETP 37(1961)161.
{'key': 'e_1_2_1_3_2', 'volume-title': 'Intermolecular and. Surface Forces', 'author': 'Israelachvili J. N.', 'year': '1985'}
/ Intermolecular and. Surface Forces by Israelachvili J. N. (1985)10.1103/PhysRevB.42.1541
10.1116/1.576397
10.1116/1.576401
10.1103/PhysRev.73.360
10.1063/1.1141911
10.1002/adma.19900021110
10.1063/1.338807
Dates
Type | When |
---|---|
Created | 20 years, 7 months ago (Dec. 30, 2004, 1:32 p.m.) |
Deposited | 1 year, 9 months ago (Oct. 30, 2023, 10:57 p.m.) |
Indexed | 1 year, 9 months ago (Nov. 1, 2023, 3:34 a.m.) |
Issued | 34 years, 8 months ago (Dec. 1, 1990) |
Published | 34 years, 8 months ago (Dec. 1, 1990) |
Published Online | 20 years, 11 months ago (Sept. 15, 2004) |
Published Print | 34 years, 8 months ago (Dec. 1, 1990) |
@article{Hartmann_1990, title={van der waals interactions in force microscopy}, volume={2}, ISSN={1521-4095}, url={http://dx.doi.org/10.1002/adma.19900021208}, DOI={10.1002/adma.19900021208}, number={12}, journal={Advanced Materials}, publisher={Wiley}, author={Hartmann, Uwe}, year={1990}, month=dec, pages={594–597} }