DOI: 10.1002/adfm.201102913. Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO<sub>2</sub>/Si Substrates

Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO2/Si Substrates

10.1002/adfm.201102913

Crossref journal-article

Wiley

Advanced Functional Materials (311)

Abstract

AbstractThere has been emerging interest in exploring single‐sheet 2D layered structures other than graphene to explore potentially interesting properties and phenomena. The preparation, isolation and rapid unambiguous characterization of large size ultrathin layers of MoS2, GaS, and GaSe deposited onto SiO2/Si substrates is reported. Optical color contrast is identified using reflection optical microscopy for layers with various thicknesses. The optical contrast of these thin layers is correlated with atomic force microscopy (AFM) and Raman spectroscopy to determine the exact thickness and to calculate number of the atomic layers present in the thin flakes and sheets. Collectively, optical microscopy, AFM, and Raman spectroscopy combined with Raman imaging data are analyzed to determine the thickness (and thus, the number of unit layers) of the MoS2, GaS, and GaSe ultrathin flakes in a fast, non‐destructive, and unambiguous manner. These findings may enable experimental access to and unambiguous determination of layered chalcogenides for scientific exploration and potential technological applications.

Bibliography

Late, D. J., Liu, B., Matte, H. S. S. R., Rao, C. N. R., & Dravid, V. P. (2012). Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO2/Si Substrates. Advanced Functional Materials, 22(9), 1894â1905. Portico.

Authors 5

Dattatray J. Late (first)
Bin Liu (additional)
H. S. S. Ramakrishna Matte (additional)
C. N. R. Rao (additional)
Vinayak P. Dravid (additional)

References 35 Referenced 476

Dates

Type	When
Created	13 years, 6 months ago (Feb. 16, 2012, 3:22 a.m.)
Deposited	1 year, 10 months ago (Oct. 11, 2023, 1:44 p.m.)
Indexed	2 hours, 20 minutes ago (Aug. 23, 2025, 9:48 p.m.)
Issued	13 years, 6 months ago (Feb. 16, 2012)
Published	13 years, 6 months ago (Feb. 16, 2012)
Published Online	13 years, 6 months ago (Feb. 16, 2012)
Published Print	13 years, 3 months ago (May 9, 2012)

Funders 0

None

BibTeX

@article{Late_2012, title={Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO2/Si Substrates}, volume={22}, ISSN={1616-3028}, url={http://dx.doi.org/10.1002/adfm.201102913}, DOI={10.1002/adfm.201102913}, number={9}, journal={Advanced Functional Materials}, publisher={Wiley}, author={Late, Dattatray J. and Liu, Bin and Matte, H. S. S. Ramakrishna and Rao, C. N. R. and Dravid, Vinayak P.}, year={2012}, month=feb, pages={1894–1905} }

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